Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

Analysis of Turn-Off Losses in MOSFETs Equipped with the Kelvin Source

Version 1 : Received: 8 August 2023 / Approved: 9 August 2023 / Online: 9 August 2023 (16:24:50 CEST)

How to cite: Rizzo, S. A.; Salerno, N.; Scuto, A.; Sorrentino, G. Analysis of Turn-Off Losses in MOSFETs Equipped with the Kelvin Source. Preprints 2023, 2023080787. https://doi.org/10.20944/preprints202308.0787.v1 Rizzo, S. A.; Salerno, N.; Scuto, A.; Sorrentino, G. Analysis of Turn-Off Losses in MOSFETs Equipped with the Kelvin Source. Preprints 2023, 2023080787. https://doi.org/10.20944/preprints202308.0787.v1

Abstract

The paper first compares the turn-off performance of two package solutions (3-lead vs 4-lead) in Super-Junction MOSFETs. It is commonly assumed that the better performance (lower switching losses) of the 4-lead is obtained thanks to the decoupling of the power and driving loop. On the contrary, in this work, the experimental results, circuit models, and Kirchhoff laws have shown that the turn-off improvement (lower turn-off losses) obtained by adopting the Kelvin source is due to the lower inductance of the driver loop in comparison with the power loop inductance, instead of the decoupling between these loops.

Keywords

Device modelling; MOSFET; Packaging; Parasitic inductance; Switching losses

Subject

Engineering, Electrical and Electronic Engineering

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