In order to reduce the influence of ground vibration generated by tractor during driving and operation on driving stability and driver ride comfort, this paper proposes a control method of tractor active seat suspension based on model predictive control. By establishing a 3-degree of freedom tractor active seat suspension model and a ground excitation input model, a new model predictive controller for the active seat suspension system is designed. The vertical acceleration of the seat center of mass, the seat suspension stroke and the tire dynamic displacement are optimized by limiting the dynamic deflection of the seat suspension and the active force output of the actuator. The control model of MPC tractor active seat suspension system is built and its performance is simulated and verified. The results show that compared with the passive seat suspension and the PID seat suspension, the tractor active seat suspension based on model predictive control (MPC) has better damping characteristics and improves ride comfort.

The total ionizing dose (TID) effect significantly impacts the electrical parameters of fully depleted silicon on insulator (FDSOI) devices and even invalidates the on-off function of devices. At present, most of the irradiation research on the circuit level is focused on the single event effect, and the research on the total ionizing dose effect is very little. Therefore, this study mainly analyzes the influence of TID effects on a CMOS inverter circuit based on 22 nm FDSOI transistors. First, we constructed and calibrated an N-type FDSOI metal-oxide semiconductor (NMOS) structure and P-type FDSOI metal-oxide semiconductor (PMOS) structure. The transfer characteristics and trapped charge distribution of these devices were studied under different irradiation doses. Next, we studied the TID effect on an inverter circuit composed of these two MOS transistors. The simulation results show that when the radiation dose is 400 krad (Si), the logic threshold drift of the inverter is approximately 0.052 V. These results help further investigate the impact on integrated circuits in the irradiation environment.