Heat stress is a serious threat to tomato production. The ultrastructure and element mapping of tomato chloroplast were investigated under different nitrogen levels to explore the regulatory effect of nitrogen on tomato chloroplast under heat stress. Experiments design two temperature treatments (25°C/15°C, as control, 40°C/30°C, as severe high-temperature, SHT ) and four nitrogen levels (0.0 kg hm-2, N1; 187.5 kg hm-2, N2; 250 kg hm-2, N3, as recommended nitrogen-application; 312.5kg hm-2 , N4) for a duration of 5 days in artificial climate chamber. The results showed that heat stress led to obvious damage to the ultrastructure of tomato chloroplast, including thylakoid stacking disorder, granum destruction, and starch grain aggregation and degradation. With the increase of nitrogen level, the ratio of long and short axes of tomato chloroplasts increased, the differentiation of chloroplasts was strengthened, the number of plastoglobuli was increased and aggregated, and the degree of damage to the ultrastructure of chloroplasts was reduced. The regulatory effect of nitrogen on the ultrastructure of tomato chloroplasts under heat stress was mainly reflected in the phosphorylation degradation process of starch granules in chloroplasts. There are obvious segmentation lines of Ca, P and Cl on both sides of the inner and outer chloroplasts, and enriched in the chloroplasts, which can outline the boundary of the chloroplasts. Element mapping analysis revealed that heat stress significantly increased the contents of calcium, phosphorus and chlorine in the chloroplast of tomato leaves, while the contents of potassium was decreased. The application of nitrogen fertilizer could significantly regulate the element distribution of tomato chloroplast under heat stress, especially the regulation of phosphorus, chlorine, calcium, magnesium. These results provide new insight into the role of nitrogen using TEM-EDX mapping in the protection of tomato chloroplast under heat stress and the mechanism of heat stress tolerance in plants.

In this study, in order to explore the failure mode of ZnO varistors under multiple lightning stroke, a 5-pulse 8/20 μs nominal lightning current with pulse intervals of 50 ms was applied to the ZnO varistors. Scanning electron microscopy (SEM) and X-ray diffractometry (XRD) were used to analyze the microstructure of the material. The failure processes of ZnO varistors caused by multiple lightning impulse current were described. The performance changes of ZnO varistors after multiple lightning impulses were analyzed from macro and micro perspectives. According to the results of this study’s experiments, the macroscopic failure mode of the ZnO varistors after multiple lightning impulse was that the electrical parameters deteriorate rapidly with the increase of the number of impulse groups, and finally destroyed by side-corner cracking. The microstructural examination indicated that after the multiple lightning strokes, the proportion of Bi in the several crystal phases had been converted, the grain size of ZnO varistors became smaller, and the white intergranular phase (Bi-rich grain boundary layer) increased significantly. The failure mechanism was thermal damage and grain boundary structure damage caused by temperature gradient thermal stress generated by multiple lightning current.