TY  - GENERIC
DO  - 10.20944/preprints202304.0525.v1
UR  - http://dx.doi.org/10.20944/preprints202304.0525.v1
TI  - Finite Element Analysis of Radiation Effects on Metal Oxide based Semiconductor (MOS) for Space Borne Application
T2  - Preprints
AU  - Duinong, Mivolil
AU  - Rasmidi, Rosfayanti
AU  - Chee, Fuei Pien
AU  - Salleh, Saafie
AU  - Rumaling, Muhammad Izzuddin
AU  - Juhim, Floressy
AU  - Abdul Rani, Abdul Ismail
AU  - Chang, Jackson Hian Wui
PY  - 2023
DA  - 2023/04/19
PB  - Preprints