TY  - GENERIC
DO  - 10.20944/preprints202402.1259.v1
UR  - http://dx.doi.org/10.20944/preprints202402.1259.v1
TI  - Extension of the Equivalent Thickness Concept to the Bifurcation of Large Semiconductor Front Side Metal Taiko Wafers Investigated by Ansys Finite Element Analysis Methods
T2  - Preprints
AU  - Vinciguerra, Vincenzo
AU  - Malgioglio, Giuseppe Luigi
AU  - Renna, Marco
PY  - 2024
DA  - 2024/02/22
PB  - Preprints