TY  - GENERIC
DO  - 10.20944/preprints202201.0360.v1
UR  - http://dx.doi.org/10.20944/preprints202201.0360.v1
TI  - An Overview of Radiation Induced Deep Level Defects in n-type 4H-SiC Studied by Junction Spectroscopy Techniques
T2  - Preprints
AU  - Capan, Ivana
PY  - 2022
DA  - 2022/01/24
PB  - Preprints