TY  - GENERIC
DO  - 10.20944/preprints201901.0098.v1
UR  - http://dx.doi.org/10.20944/preprints201901.0098.v1
TI  - Pilot Feedback Electronic Imaging at Elevated Temperatures and its Potential for In-Process Electron Beam Melting Monitoring
T2  - Preprints
AU  - Wong, Hay
AU  - Neary, Derek
AU  - Jones, Eric
AU  - Fox, Peter
AU  - Sutcliffe, Chris
PY  - 2019
DA  - 2019/01/10
PB  - Preprints