TY  - GENERIC
DO  - 10.20944/preprints202404.0339.v1
UR  - http://dx.doi.org/10.20944/preprints202404.0339.v1
TI  - Research on Single Event Burnout Reinforcement Structure of SiC MOSFET
T2  - Preprints
AU  - Liao, Qiulan
AU  - Liu, Hongxia
PY  - 2024
DA  - 2024/04/04
PB  - Preprints