TY  - GENERIC
DO  - 10.20944/preprints202307.0738.v1
UR  - http://dx.doi.org/10.20944/preprints202307.0738.v1
TI  - The Effect of Heavy Doping Layer on Charge Collection Efficiency in P-type Silicon Substrate of EBCMOS Devices
T2  - Preprints
AU  - Qin, XuLei
AU  - Shi, QiDong
AU  - Li, Ye
AU  - Song, De
AU  - Shi, Feng
PY  - 2023
DA  - 2023/07/11
PB  - Preprints