TY  - GENERIC
DO  - 10.20944/preprints202405.0880.v1
UR  - http://dx.doi.org/10.20944/preprints202405.0880.v1
TI  - A Comprehensive Research on Unclamped-Inductive-Switching (UIS)-Induced Electrical Parameters Degradations and Optimizations for 4H-SiC Trench MOSFETs Structures
T2  - Preprints
AU  - Liu, Li
AU  - Guo, Jingqi
AU  - Shi, Yiheng
AU  - Zeng, Kai
AU  - Li, Gangpeng
PY  - 2024
DA  - 2024/05/13
PB  - Preprints