Han, M.; Smith, D.; Kahro, T.; Stonytė, D.; Kasikov, A.; Gailevičius, D.; Tiwari, V.; Ignatius Xavier, A.P.; Gopinath, S.; Ng, S.H.; John Francis Rajeswary, A.S.; Tamm, A.; Kukli, K.; Bambery, K.; Vongsvivut, J.; Juodkazis, S.; Anand, V. Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride. Micromachines2024, 15, 537.
Han, M.; Smith, D.; Kahro, T.; Stonytė, D.; Kasikov, A.; Gailevičius, D.; Tiwari, V.; Ignatius Xavier, A.P.; Gopinath, S.; Ng, S.H.; John Francis Rajeswary, A.S.; Tamm, A.; Kukli, K.; Bambery, K.; Vongsvivut, J.; Juodkazis, S.; Anand, V. Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride. Micromachines 2024, 15, 537.
Han, M.; Smith, D.; Kahro, T.; Stonytė, D.; Kasikov, A.; Gailevičius, D.; Tiwari, V.; Ignatius Xavier, A.P.; Gopinath, S.; Ng, S.H.; John Francis Rajeswary, A.S.; Tamm, A.; Kukli, K.; Bambery, K.; Vongsvivut, J.; Juodkazis, S.; Anand, V. Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride. Micromachines2024, 15, 537.
Han, M.; Smith, D.; Kahro, T.; Stonytė, D.; Kasikov, A.; Gailevičius, D.; Tiwari, V.; Ignatius Xavier, A.P.; Gopinath, S.; Ng, S.H.; John Francis Rajeswary, A.S.; Tamm, A.; Kukli, K.; Bambery, K.; Vongsvivut, J.; Juodkazis, S.; Anand, V. Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride. Micromachines 2024, 15, 537.
Abstract
Axial resolution is one of the most important characteristics of a microscope. In all microscopes, a high axial resolution is desired in order to discriminate information efficiently along the longitudinal direction. However, when studying thick samples that do not contain laterally overlapping information, a low axial resolution is desirable as information from multiple planes can be recorded simultaneously from a single camera shot instead of plane-by-plane mechanical refocusing. In this study, we increased the focal depth of an infrared microscope non-invasively by introducing a binary axicon fabricated on barium fluoride substrate close to the sample. Preliminary results of imaging thick and sparse silk fibers showed an improved focal depth with a slight decrease in lateral resolution and increase in background noise.
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