TY  - GENERIC
DO  - 10.20944/preprints201810.0199.v1
UR  - http://dx.doi.org/10.20944/preprints201810.0199.v1
TI  - Fault Detection Probability Evaluation Approach in Combinational Circuits Using Test Set Generation Method
T2  - Preprints
AU  - Arya, Namita
AU  - Singh, Amit Prakash
PY  - 2018
DA  - 2018/10/10
PB  - Preprints