TY  - GENERIC
DO  - 10.20944/preprints201701.0064.v1
UR  - http://dx.doi.org/10.20944/preprints201701.0064.v1
TI  - Identification of Secondary Phases in Cu<sub>2</sub>ZnSnS<sub>4</sub> Layers by In-depth Resolved X-ray Photoelectron Spectroscopy Analysis
T2  - Preprints
AU  - Zhang, Xianfeng
AU  - Kobayashi, M.
PY  - 2017
DA  - 2017/01/12
PB  - Preprints